What is inside the Scanning Electron Microscope? Explained in detail with Animated Videos
A Scanning Electron Microscope (SEM) is a highly advanced instrument, and its internal structure is very different from an X-ray tube. Inside an SEM, multiple subsystems work together to generate and control an electron beam and produce high-resolution images. Main Components Inside an SEM 1. Electron Gun (Source) Produces electrons Types: Tungsten filament (thermionic emission) Field emission gun (FEG – high resolution) Function: Generates the primary electron beam 2. Anode Positively charged plate Accelerates electrons to high energy (1–30 keV) Function: Controls beam energy 3. Condenser Lenses Electromagnetic lenses Control beam size and intensity Function: Focuses the beam before it reaches the sample 4. Objective Lens Final focusing lens near the sample Function: Produces a very fine electron probe ( nm scale) 5. Scanning Coils or Scanner Deflect the beam in X–Y directions Function: Scan the beam over the sample surface (raster scan) 6. Sa...